ImgBeamer

Try it live here, no setup or installation required!

Simple demo tool of the image formation1 process used in a Scanning Electron Microscope (SEM).

A quick start guide is available here.

The source code is available here.

Description of Stages / Boxes

  1. Sample Ground Truth (map navigation): a view the full image where the highlighted area represents the subregion area.
  2. Subregion or ROI (Region of Interest) View (“zoomed” view): a view of the subregion area as highlighted in the Sample Ground Truth.
  3. Spot Profile: visualization of the spot profile (shape and size) by changing the relative width/height, scale, and rotation.
  4. Spot Content: visualization of the spot content (Subregion “stenciled” with the spot profile) or area sampled by the spot.
  5. Spot Signal (rgba): the signal or pixel value to represent what has been sampled by the spot or beam, or the average pixel value from the Spot Content.
  6. Spot Layout: the layout of the sampling grid or array of spot sampling positions over the Subregion area.
  7. Sampled Subregion: the sampled or “stenciled” content of the Subregion as depicted by the Spot Layout.
  8. Resulting Subregion: the resulting image by filing each pixel in the grid by the signal of each corresponding spot as depicted in the Spot Layout.
  9. Resulting Image (full, “virtual SEM”): the resulting image full where the imaging process, as shown in the Resulting Subregion, is continued for the full extent of the Sample Ground Truth image.

Screenshot

screenshot

Notes

Developer Instructions and Notes

References

  1. “Image Formation.” In Scanning Electron Microscopy and X-Ray Microanalysis, edited by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, and David C. Joy, 93–110. New York, NY: Springer, 2018. https://doi.org/10.1007/978-1-4939-6676-9_6.
  2. Fant, Karl M. “A Nonaliasing, Real-Time Spatial Transform Technique.” IEEE Computer Graphics and Applications 6, no. 1 (January 1986): 71–80. https://doi.org/10.1109/MCG.1986.276613.